STRESS TEST QUALIFICATION FOR AUTOMOTIVE GRADE DISCRETE SEMICONDUCTORS-AEC_Q101_REV_C
本文档由 本.约翰 分享于2011-11-16 19:19
This document defines minimum stress test driven qualification requirements and references test conditions for qualification of discrete semiconductors (e.g. transistors, diodes, etc.). This document does not relieve the supplier of their responsibility to meet their own company´s internal qualification program. Additionally, this document does not relieve the ..
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君,已阅读到文档的结尾了呢~~